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Resultats - Iñiguez Nicolau, Benjamin


Iñiguez Nicolau, Benjamin

Tesis Doctorals Dirigides / Theses 
2020 2021 2022 2023 2024
Títol: Compact Modeling of Schottky Barrier and Reconfigurable Field-Effect Transistors
Autor: Römer, Christian
Director: Iñiguez Nicolau, Benjamin
Universitat: N/D
Any: 2024
País: N/D
Títol: Compact Modeling of Variability in Organic Thin-Film Transistors
Autor: Nikolaou, Aristeidis
Director: Iñiguez Nicolau, Benjamin
Universitat: N/D
Any: 2023
País: N/D
Títol: Charge-Based Compact Modeling of Capacitances and Low-Frequency Noise in Organic Thin-Film Transistors
Autor: Jakob Leise
Director: Alexander Kloes; Iñiguez Nicolau, Benjamin
Universitat: N/D
Any: 2022
País: N/D
Títol: Compact DC Modelling of Short-Channel Effects in Organic Thin-Film Transistors
Autor: Jakob Pruefer
Director: Alexander Kloes; Iñiguez Nicolau, Benjamin
Universitat: N/D
Any: 2022
País: N/D
Títol: Charge-Based Compact Modeling of Capacitances and Low-Frequency Noise in Organic Thin-Film Transistors
Autor: Leise, Jakob Simon
Director: Iñiguez Nicolau, Benjamin
Universitat: N/D
Any: 2022
País: N/D
Títol: Compact DC Modelling of Short-Channel Effects in Organic Thin-Film Transistors
Autor: Prüfer, Jakob Markus
Director: Iñiguez Nicolau, Benjamin
Universitat: N/D
Any: 2022
País: N/D
Títol: Compact modeling of intrinsic capacitances in double-gate tunnel-fets
Autor: Atieh Farokhnejad
Director: Lime, François Gilbert Marie (Autor O Coautor) ; Benjamín Iñiguez Nicolau; François Lime; Alexander Gunther Klös
Universitat: N/D
Any: 2020
País: N/D
Títol: Physical behaviour analysis and compact temperature-dependent modeling in Organic and IGZO TFTs
Autor: Cortes Ordoñez, Harold
Director: Iñiguez Nicolau, Benjamin
Universitat: N/D
Any: 2020
País: N/D
Títol: Compact Modeling of Intrinsic Capacitances in Double-Gate Tunnel-FETs
Autor: Farokhnejad, Atieh
Director: Iñiguez Nicolau, Benjamin; Lime, François Gilbert Marie
Universitat: N/D
Any: 2020
País: N/D
Títol: Physical behaviour analysis and compact temperature-dependent modeling in organic and igzo tfts
Autor: Harold Cortés Ordóñez
Director: Benjamín Iñiguez Nicolau
Universitat: N/D
Any: 2020
País: N/D
Publicacions en Revista / Papers 
2020 2021 2022 2023 2024
Títol: Roadmap for Schottky barrier transistors
Autors: Bestelink E; Galderisi G; Golec P; Han Y; Iniguez B; Kloes A; Knoch J; Matsui H; Mikolajick T; Niang KM; Richstein B; Schwarz M; Sistani M; Sporea RA; Trommer J; Weber WM; Zhao QT; Calvet LE
Any: 2024 Clau: Review
Revista: Nano Futures
País: N/D
Títol: Roadmap for Schottky barrier transistors
Autors: Bestelink, Eva; Galderisi, Giulio; Golec, Patryk; Han, Yi; Iniguez, Benjamin; Kloes, Alexander; Knoch, Joachim; Matsui, Hiroyuki; Mikolajick, Thomas; Niang, Kham M; Richstein, Benjamin; Schwarz, Mike; Sistani, Masiar; Sporea, Radu A; Trommer, Jens; Weber, Walter M; Zhao, Qing-Tai; Calvet, Laurie E
Any: 2024 Clau: Review
Revista: Nano Futures
País: N/D
Títol: DETERMING THE CHARACTERISTICS OF THE LOCALIZED DENSITY OF STATES DISTRIBUTION PRESENT IN MOS2 2D FETS
Autors: Broche, Anisleidy; Cerdeira, Antonio; Iniguez, Benjamin; Estrada, Magali
Any: 2024 Clau: Article
Revista: Facta Universitatis (Nis), Series: Electronics And Energetics
País: N/D
Títol: A new analytical method for modeling a 2D electrostatic potential in MOS devices, applicable to compact modeling
Autors: Lime, F; Iniguez, B; Kloes, A
Any: 2024 Clau: Article
Revista: Journal Of Applied Physics
País: N/D
Títol: Unified Charge Control Model for Back-Gated 2-D Field Effect Transistors
Autors: Mounir, A; Iñiguez, B; Lime, F; Kloes, A; Knobloch, T; Grasser, T
Any: 2024 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Unified Charge Control Model for Back-Gated 2-D Field Effect Transistors
Autors: Mounir, Ahmed; Iniguez, Benjamin; Lime, Francois; Kloes, Alexander; Knobloch, Theresia; Grasser, Tibor
Any: 2024 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Gaussian DOS Charge-Based DC Compact Modeling of High-Speed Organic Transistors
Autors: Pashaki, Elahe Rastegar; Leise, Jakob; Iniguez, Benjamin; Kleemann, Hans; Kloes, Alexander; Darbandy, Ghader
Any: 2024 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Physics-based compact current model for Schottky barrier transistors at deep cryogenic temperatures including band tail effects and quantum oscillations
Autors: Roemer, C; Dersch, N; Darbandy, G; Schwarz, M; Han, Y; Zhao, QT; Iniguez, B; Kloes, A
Any: 2024 Clau: Article
Revista: Solid-State Electronics
País: N/D
Títol: THM-OTFT: A Complete Physics-Based Verilog-A Compact Model for Short-Channel Organic Thin-Film Transistors
Autors: Kloes A; Leise J; Pruefer J; Nikolaou A; Iniguez B; Gneiting T; Klauk H; Darbandy G
Any: 2023 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: THM-OTFT: A Complete Physics-Based Verilog-A Compact Model for Short-Channel Organic Thin-Film Transistors
Autors: Kloes, Alexander; Leise, Jakob; Pruefer, Jakob; Nikolaou, Aristeidis; Iniguez, Benjamin; Gneiting, Thomas; Klauk, Hagen; Darbandy, Ghader
Any: 2023 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Device Physics, Modeling and Simulation of Organic Electrochemical Transistors
Autors: Koch M; Tseng H; Weissbach A; Iniguez B; Leo K; Kloes A; Kleemann H; Darbandy G
Any: 2023 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Device Physics, Modeling and Simulation of Organic Electrochemical Transistors
Autors: Koch, Malte; Tseng, Hsin; Weissbach, Anton; Iniguez, Benjamin; Leo, Karl; Kloes, Alexander; Kleemann, Hans; Darbandy, Ghader
Any: 2023 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Compact I-V model for back-gated and double-gated TMD FETs
Autors: Mounir A; Iñiguez B; Lime F; Kloes A; Knobloch T; Grasser T
Any: 2023 Clau: Article
Revista: Solid-State Electronics
País: N/D
Títol: Compact model for the bias-depended low-frequency noise in organic thin-film transistors due to carrier-number and mobility-fluctuation effects
Autors: Nikolaou A; Leise J; Zschieschang U; Klauk H; Gneiting T; Darbandy G; Iñiguez B; Kloes A
Any: 2023 Clau: Article
Revista: Organic Electronics
País: N/D
Títol: Compact modeling of Schottky barrier field-effect transistors at deep cryogenic temperatures
Autors: Roemer C; Dersch N; Darbandy G; Schwarz M; Han Y; Zhao QT; Iñíguez B; Kloes A
Any: 2023 Clau: Article
Revista: Solid-State Electronics
País: N/D
Títol: The Schottky barrier transistor in emerging electronic devices
Autors: Schwarz M; Vethaak TD; Derycke V; Francheteau A; Iniguez B; Kataria S; Kloes A; Lefloch F; Lemme M; Snyder JP; Weber WM; Calvet LE
Any: 2023 Clau: Review
Revista: Nanotechnology
País: N/D
Títol: Electrical Evolution of p-Type SnO<inline-formula> <tex-math notation=LaTeX>$_{\textit{x}}$</tex-math> </inline-formula> Film and Transistor Deposited by RF Magnetron Sputtering
Autors: Zhou, Yuyan; Song, Yu; Hong, Ruohao; Liu, Xingqiang; Zou, Xuming; Iniguez, Benjamin; Flandre, Denis; Li, Guoli; Liao, Lei
Any: 2023 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Enhanced stability and mobility of solution-processed oxide thin-film transistors with bilayer terbium-incorporated indium oxide channel
Autors: He, Penghui; Ding, Chunchun; Zou, Xuming; Li, Guoli; Hu, Wei; Ma, Chao; Flandre, Denis; Iniguez, Benjamin; Liao, Lei; Lan, Linfeng; Liu, Xingqiang;
Any: 2022 Clau: Article
Revista: Applied Physics Letters
País: N/D
Títol: Effect of Humidity on Properties of Aqueous-processed Tb-Doped Indium Oxide Thin-Film Transistors
Autors: He, Penghui; Hong, Ruohao; Li, Guoli; Zou, Xuming; Hu, Wei; Lan, Linfeng; Iniguez, Benjamin; Liao, Lei; Liu, Xingqiang
Any: 2022 Clau: Article
Revista: Ieee Electron Device Letters
País: N/D
Títol: Modeling the Short-Channel Effects in Coplanar Organic Thin-Film Transistors
Autors: Pruefer, Jakob; Leise, Jakob; Borchert, James W; Klauk, Hagen; Darbandy, Ghader; Nikolaou, Aristeidis; Iniguez, Benjamin; Gneiting, Thomas; Kloes, Alexander
Any: 2022 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Physics-Based DC Compact Modeling of Schottky Barrier and Reconfigurable Field-Effect Transistors
Autors: Roemer, Christian; Darbandy, Ghader; Schwarz, Mike; Trommer, Jens; Heinzig, Andre; Mikolajick, Thomas; Weber, Walter M; Iniguez, Benjamin; Kloes, Alexander
Any: 2022 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Cryogenic Temperature and Doping Analysis of Source-to-Drain Tunneling Current in Ultrashort-Channel Nanosheet MOSFETs
Autors: Yilmaz, Kerim; Iniguez, Benjamin; Lime, Francois; Kloes, Alexander
Any: 2022 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Quasi-Compact Model of Direct Source-to-Drain Tunneling Current in Ultrashort-Channel Nanosheet MOSFETs by Wavelet Transform
Autors: Yilmaz, Kerim; Iniguez, Benjamin; Lime, Francois; Kloes, Alexander
Any: 2022 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: The 2021 flexible and printed electronics roadmap
Autors: Bonnassieux Y; Brabec CJ; Cao Y; Carmichael TB; Chabinyc ML; Cheng KT; Cho G; Chung A; Cobb CL; Distler A; Egelhaaf HJ; Grau G; Guo X; Haghiashtiani G; Huang TC; Hussain MM; Iniguez B; Lee TM; Li L; Ma Y; Ma D; McAlpine MC; Ng TN; Österbacka R; Patel SN; Peng J; Peng H; Rivnay J; Shao L; Steingart D; Street RA; Subramanian V; Torsi L; Wu Y
Any: 2021 Clau: Review
Revista: Flexible And Printed Electronics
País: N/D
Títol: Analytical I-V and C-V models for symmetric double-gate AOSTFTs
Autors: Hernandez-Barrios, Y.; Estrada, M.; Pashkovich, A.; Muhea, W. E.; Iniguez, B.; Cerdeira, A.;
Any: 2021 Clau: Article
Revista: Semiconductor Science And Technology
País: N/D
Títol: Dynamic simulation of a-IGZO TFT circuits using the Analytical Full Capacitance Model (AFCM)
Autors: Hernandez-Barrios, Y; Gaspar-Angeles, J N; Estrada, M; Iniguez, B; Cerdeira, A
Any: 2021 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Effects of Thermal Annealing on the Density of States in Low Voltage Operating Range, High Mobility, Hf-In-ZnO/HfO2 TFTs Fabricated at Temperatures Below 200oC
Autors: Hernández IS; Garduño SI; Cerdeira A; Iñiguez B; Estrada M
Any: 2021 Clau: Article
Revista: Journal Of Integrated Circuits And Systems
País: N/D
Títol: New Compact Modeling Solutions for Organic and Amorphous Oxide TFTs
Autors: Iniguez, Benjamin; Nathan, Arokia; Kloes, Alexander; Bonnassieux, Yvan; Romanjek, Krunoslav; Charbonneau, Micael; Van der Steen, Jan Laurens; Gelinck, Gerwin; Gneiting, Thomas; Mohamed, Firas; Ghibaudo, Gerard; Cerdeira, Antonio; Estrada, Magali; Mijalkovic, Slobodan; Nejim, Ahmed
Any: 2021 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Flexible megahertz organic transistors and the critical role of the device geometry on their dynamic performance
Autors: Leise, J.; Pruefer, J.; Darbandy, G.; Nikolaou, A.; Giorgio, M.; Caironi, M.,;Zschieschang, U.;Klauk, H.; Kloes, A.;Iñiguez, B.; Borchert, J. W
Any: 2021 Clau: Article
Revista: Journal Of Applied Physics
País: N/D
Títol: Flexible megahertz organic transistors and the critical role of the device geometry on their dynamic performance
Autors: Leise, Jakob; Pruefer, Jakob; Darbandy, Ghader; Nikolaou, Aristeidis; Giorgio, Michele; Caironi, Mario; Zschieschang, Ute; Klauk, Hagen; Kloes, Alexander; Iniguez, Benjamin; Borchert, James W
Any: 2021 Clau: Article
Revista: Journal Of Applied Physics
País: N/D
Títol: Non-Linear Output-Conductance Function for Robust Analysis of Two-Dimensional Transistors
Autors: Li, Guoli; Fan, Zizheng; Andre, Nicolas; Xu, Yongye; Xia, Ying; Iniguez, Benjamin; Liao, Lei; Flandre, Denis
Any: 2021 Clau: Article
Revista: Ieee Electron Device Letters
País: N/D
Títol: Compact DC and Quasi-Static Capacitances Modeling of a-Si:H TFTs, Including Parasitic Capacitances
Autors: Lime, Francois; Cerdeira, Antonio; Estrada, Magali; Pashkovich, Andrei; Iniguez, Benjamin
Any: 2021 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Noise-Based Simulation Technique for Circuit-Variability Analysis
Autors: Nikolaou, Aristeidis; Leise, Jakob; Pruefer, Jakob; Zschieschang, Ute; Klauk, Hagen; Darbandy, Ghader; Iniguez, Benjamin; Kloes, Alexander
Any: 2021 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Compact Modeling of Nonlinear Contact Effects in Short-Channel Coplanar and Staggered Organic Thin-Film Transistors
Autors: Pruefer, Jakob; Leise, Jakob; Nikolaou, Aristeidis; Borchert, James W; Darbandy, Ghader; Klauk, Hagen; Iniguez, Benjamin; Gneiting, Thomas; Kloes, Alexander
Any: 2021 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: The flexible and printed electronics roadmap
Autors: Yvan Bonnassieux, Christoph J. Brabec, Yong Cao, Tricia Breen Carmichael, Michael L. Chabinyc, Kwang Ting Cheng, Gyoujin Cho, Anjung Chung, Corie L. Cobb, Andreas Distler, Hans Joachim Egelhaaf, Gerd Grau, Xiaojun Guo, Ghazaleh Haghiashtiani, Tsung Ching Huang, Muhammad M. Hussain, Benjamin Iniguez, Taik Min Lee, Ling Li, Yuguang Ma, Dongge Ma, Michael C. McAlpine, Tse Nga Ng, Ronald Österbacka*, Shrayesh N. Patel, Junbiao Peng, Huisheng Peng, Jonathan Rivnay, Leilai Shao, Daniel Steingart, Robert A. Street, Vivek Subramanian, Luisa Torsi, Yunyun Wu
Any: 2021 Clau: Article
Revista: Flexible And Printed Electronics
País: N/D
Títol: Parameter Extraction and Compact Modeling of OTFTs From 150 K to 350 K
Autors: Cortes-Ordonez, Harold; Haddad, C; Mescot, Xavier; Romanjek, Krunoslav; Ghibaudo, Gerard; Estrada, Magali; Cerdeira, Antonio; Iniguez, Benjamin
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Analytical current-voltage model for double-gate a-IGZO TFTs with symmetric structure for above threshold
Autors: Hernandez-Barrios Y; Cerdeira A; Estrada M; Iniguez B
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Foreword Special Issue on Compact Modeling of Semiconductor Devices
Autors: Iniguez B; Chauhan YS; Mijalkovic S; Xia K; Goo JS; Pavanello M; Mierzwinski M; Grabinski W
Any: 2020 Clau: Editorial
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: A compact model of transconductance and drain conductance for DMG-GC-DOT cylindrical gate MOSFET
Autors: Jaafar H; Aouaj A; Bouziane A; Iñiguez B
Any: 2020 Clau: Article
Revista: International Journal Of Reconfigurable And Embedded Systems
País: N/D
Títol: Surface potential modeling of dual metal gate-graded channel-dual oxide thickness with two dielectric constant different of surrounding gate MOSFET
Autors: Jaafar H; Aouaj A; Bouziane A; Iñiguez B
Any: 2020 Clau: Article
Revista: International Journal Of Reconfigurable And Embedded Systems
País: N/D
Títol: Macromodel for AC and Transient Simulations of Organic Thin-Film Transistor Circuits including Nonquasistatic Effects
Autors: Leise J; Pruefer J; Nikolaou A; Darbandy G; Klauk H; Iniguez B; Kloes A
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Charge-Based Compact Modeling of Capacitances in Staggered Multi-Finger OTFTs
Autors: Leise, Jakob; Pruefer, Jakob; Darbandy, Ghader; Seifaei, Masoud; Manoli, Yiannos; Klauk, Hagen; Zschieschang, Ute; Iniguez, Benjamin; Kloes, Alexander;
Any: 2020 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Macromodel for AC and Transient Simulations of Organic Thin-Film Transistor Circuits including Nonquasistatic Effects
Autors: Leise, Jakob; Pruefer, Jakob; Nikolaou, Aristeidis; Darbandy, Ghader; Klauk, Hagen; Iniguez, Benjamin; Kloes, Alexander
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Non-Linear Output-Conductance Function for Robust Analysis of Two-Dimensional Transistors
Autors: Li G; Fan Z; Andre N; Xu Y; Xia Y; Iniguez B; Liao L; Flandre D
Any: 2020 Clau: Article
Revista: Ieee Electron Device Letters
País: N/D
Títol: Parameter Extraction and Compact Modeling of 1/f Noise for Amorphous ESL IGZO TFTs
Autors: Muhea WE; Castillo GU; Ordonez HC; Gneiting T; Ghibaudo G; Iniguez B
Any: 2020 Clau: Article
Revista: Ieee Journal Of The Electron Devices Society
País: N/D
Títol: Charge-Based Model for the Drain-Current Variability in Organic Thin-Film Transistors Due to Carrier-Number and Correlated-Mobility Fluctuation
Autors: Nikolaou A; Darbandy G; Leise J; Pruefer J; Borchert JW; Geiger M; Klauk H; Iniguez B; Kloes A
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Charge-Based Model for the Drain-Current Variability in Organic Thin-Film Transistors Due to Carrier-Number and Correlated-Mobility Fluctuation
Autors: Nikolaou, Aristeidis; Darbandy, Ghader; Leise, Jakob; Pruefer, Jakob; Borchert, James W; Geiger, Michael; Klauk, Hagen; Iniguez, Benjamin; Kloes, Alexander
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Compact Modeling of Short-Channel Effects in Staggered Organic Thin-Film Transistors
Autors: Pruefer J; Leise J; Darbandy G; Nikolaou A; Klauk H; Borchert JW; Iniguez B; Gneiting T; Kloes A
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Compact Modeling of Short-Channel Effects in Staggered Organic Thin-Film Transistors
Autors: Pruefer, Jakob; Leise, Jakob; Darbandy, Ghader; Nikolaou, Aristeidis; Klauk, Hagen; Borchert, James W; Iniguez, Benjamin; Gneiting, Thomas; Kloes, Alexander
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Títol: Equivalent DG Dimensions Concept for Compact Modeling of Short-Channel and Thin Body GAA MOSFETs Including Quantum Confinement
Autors: Yilmaz, Kerim; Darbandy, Ghader; Reimbold, Gilles; Iniguez, Benjamin; Lime, Francois; Kloes, Alexander
Any: 2020 Clau: Article
Revista: Ieee Transactions On Electron Devices
País: N/D
Llibres / Books 
2020 2021 2022 2023 2024
Capítols de Llibre / Book chapters 
2020 2021 2022 2023 2024
Títol: Flexible and Printed Electronics, in More than Moore Devices and Integration for Semiconductors
Autors: IÑIGUEZ NICOLAU, BENJAMIN
Any: 2023 Clau: Book Chapters
Títol: Flexible and Printed Electronics
Autors: Iñiguez B
Any: 2023 Clau: Book Chapters
Altres Documents / Other documents 
2020 2021 2022 2023 2024
Patents Sol.licitades / Patents 
2020 2021 2022 2023 2024
Congressos / Conferences 
2020 2021 2022 2023 2024
Autor/a: [189] L. E. Calvet, P. Coulson, B. Iniguez, and K. Romanjek
Títol: Unified Charge Control Model for MoS2 FET
Congrés/acte: N/D
Congrés/acte: Speaker
Any: 2022
Autor/a: IÑIGUEZ NICOLAU, BENJAMIN
Títol: Numerical Exploration of Spiking Neuron Circuits in Organic Potft Technology
Congrés/acte: N/D
Congrés/acte: Speaker
Any: 2021